“Toward superfast three-dimensional optical metrology with digital micromirror device platforms,” Opt. Eng., 2014

T. Bell and S. Zhang, “Toward superfast three-dimensional optical metrology with digital micromirror device platforms,” Opt. Eng., 53(11), 112206, 2014; doi: 10.1117/1.OE.53.11.112206 ABSTRACT This paper presents a novel method for representing three-dimensional (3D) range data within regular two-dimensional (2D) images using multiwavelength encoding. These 2D images can then be further compressed using traditional lossless (e.g., PNG) or lossy (e.g., JPEG) […]